介電常數(shù)介質損耗試驗儀/介電常數(shù)測試儀
產(chǎn)品概述
它符合國標GB/T 1409-2006,GB/T 1693-2007,美標ASTM D150以及IEC60250規(guī)范要求。
c類數(shù)顯Q表工作頻率范圍是10kHz~60MHz,是一種多功能、多用途、多量程數(shù)字化阻抗測試儀器。它是根據(jù)串聯(lián)諧振原理,以電壓比值刻度Q值的。它能測量高頻電感器的Q值,電感量和分布電容量;電容器的電容量和損耗角。配以夾具BH916介質損耗裝置還能對固態(tài)絕緣材料的高頻介質損耗(tanδ)和介電常數(shù)(ε),高頻回路有效并聯(lián)及串聯(lián)電阻,傳輸線的特性阻抗等進行測試。本Q表依照國家計量檢定規(guī)程:“JJF1073-2000高頻Q表校準規(guī)范”執(zhí)行。
1 特點:
◎ 本公司創(chuàng)新的自動Q值讀取技術,使測Q分辨率至0.1Q。
◎ DPLL合成發(fā)生1kHz~70MHz,測試信號。
◎ 低至20nH殘余電感,保證高頻時直讀Q值的誤差較小。
◎ 特制LCD屏菜單式顯示多參數(shù):Q值,測試頻率,調諧狀態(tài)等。
◎ Q值量程自動/手動量程控制。
◎ 數(shù)字化Q值預置,能提高批量測試的可靠性和速度。
2 主要技術指標:
2.1 測試信號頻率范圍:1kHz~70MHz,數(shù)字合成,可數(shù)字設置或連續(xù)調節(jié),五位有效數(shù)顯。
2.2 Q值測量范圍:1~1000四位數(shù)顯,分辨率0.1Q。分100、316、999三檔,量程可自動切換。
2.3 Q值固有誤差:±5%±3% 滿刻度值。
2.4 有效電感測量范圍:0.1µH~1000mH。
2.5 電感測量誤差:≤5%±0.02µH
2.6 調諧電容特性:
2.6.1可調電容范圍:40pF~500 pF。
2.6.2 精確度:±1% 或0.5pF。
2.6.3微調電容器:-3pF~0~+3pF,分辨率:0.2pF
2.6.4殘余電感值:約30nH。
2.7 Q預置功能:Q預置范圍:1~1000均可。被測件達到預置值后有“GO”顯示和蜂鳴聲提示。不合格件則顯示“NO GO”。
2.8 外形尺寸及重量:415×180×170(mm),6.5kg。
BH916 介質損耗測試裝置(數(shù)顯)
BH916D介質損耗測試裝置與C類Q表及電感器配用,能對絕緣材料進行高頻介質損耗角正切值(tanδ)和介電常數(shù)(ε)的測試。它符合國標GB/T 1409-2006,GB/T 1693-2007,美標ASTM D150以及IEC60250規(guī)范要求。
本測試裝置是由測微平板電容器組成,平板電容器一般用來夾被測樣品,配用Q表作為指示儀器。絕緣材料的損耗角正切值是通過被測樣品放進平板電容器和不放進樣品的Q值變化和厚度的刻度讀數(shù)變化通過公式計算得到。同樣,由平板電容器的刻度讀數(shù)變化,通過公式計算得到介電常數(shù)。
1工作特性
1.1 平板電容器:
1.1.1 極片尺寸:
WY916D-38:Φ38mm.
WY916D-50:Φ50mm.
1.1.2 極片間距可調范圍和分辨率:
≥8mm, ±0.002mm
1.2 夾具插頭間距:
25mm±1mm
1.3夾具損耗角正切值
≤2.5×10-4
附表二,LKI-1電感組典型測試數(shù)據(jù)
線圈號 測試頻率 Q值 分布電容p 電感值
9 100KHz 98 9.4 25mH
8 400KHz 138 11.4 4.87mH
7 400KHz 202 16 0.99mH
6 1MHz 196 13 252μH
5 2MHz 198 8.7 49.8μH
4 4.5MHz 231 7 10μH
3 12MHz 193 6.9 2.49μH
2 12MHz 229 6.4 0.508μH
1 25MHz 50MHz 233211 0.9 0.125μH
標簽:介電常數(shù)介質損耗測試儀 介電常數(shù)測試儀 介質損耗測試儀 介質損耗介電常數(shù)測試儀
It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 and IEC60250 specifications.
Class C digital Q frequency range is 10kHz ~ 60MHz, is a multifunctional,multipurpose, multi range digital impedance test instrument. It is based on theprinciple of series resonance, the voltage ratio scales of Q value. It can measure theQ value of the high frequency inductor, inductance and distributed capacitance;capacitance and loss angle. With a dedicated fixture BH916 dielectric loss device also on high frequency dielectric loss of solid insulating materials (tan delta) and Permittivity (epsilon), high frequency circuit in parallel and series resistance, the characteristic impedance of the transmission line were investigated. The Q table in accordance with the national metrological verification regulations: "JJF1073-2000 high frequency Q calibration specification".
1 characteristics:
Read the technology of automatic Q of the company innovation value, the Qresolution to 0.1Q.
The synthesis of DPLL 1kHz ~ 70MHz, the test signal.
In the low to 20nH residual inductance, high frequency to ensure error is smaller by Q value.
Multi parameter of the special LCD screen menu display: Q value, the test frequency,the tuning status.
The Q value range automatic / manual range control.
The digital Q value preset, can improve the speed and reliability of the batch test.
2 main technical indexes:
The 2.1 test signal frequency range: 1kHz ~ 70MHz, digital synthesis, digital set oradjusted continuously, five effective digital display.
2.2 Q value range: 1 ~ 1000 four bit digital display, resolution 0.1Q. In 100, 316, 999third, range can be automatically switched.
2.3 Q values inherent error: ± 5% ± 3% of full scale value.
2.4 the effective inductance measurement range: 0.1 µ H ~ 1000mH.
The 2.5 inductance measurement error: = 5% ± 0.02 µ H
2.6 tuning capacitance characteristics:
2.6.1 adjustable capacitance range: 40pF ~ 500 pF.
2.6.2: accuracy of ± 1% or 0.5pF.
2.6.3 tuning capacitors are: -3pF ~ 0 ~ +3pF, resolution: 0.2pF
2.6.4 residual inductance: about 30nH.
2.7 Q preset function: Q preset range: 1 ~ 1000 may. The measured piece reaches a preset value "GO" display and beep prompt. The unqualified parts is displayed "NOGO".
2.8 dimensions and weight: 415 x 180 x 170 (mm), 6.5kg.
BH916 dielectric loss test device (Shu Xian)
Dielectric loss test device and the C BH916D Q table and the inductor with theinsulating materials, high frequency dielectric loss tangent (tan delta) and Permittivity(epsilon) test. It accords with the national standard GB/T 1409-2006, GB/T 1693-2007, American Standard ASTM D150 and IEC60250 specifications.
The testing device is composed of a micrometer capacitor plate, plate capacitor is usually used to clamp the sample, equipped with the Q table as indicating instrument.Insulating material loss angle tangent value is calculated by the formula of scale reading changes through the tested sample into the panel capacitor and do not put it in the samples of Q value change and the thickness of the obtained. Similarly, thescale reading changes of the panel capacitor, to obtain the dielectric constant is calculated by a formula.
The 1 job characteristics
1.1 the panel capacitor:
1.1.1 sheet size:
WY916D-38: a 38mm.
WY916D-50: a 50mm.
The 1.1.2 pole spacing adjustable range and resolution:
≥ 8mm, ± 0.002mm
The 1.2 fixture plug spacing:
25mm + 1mm
The 1.3 fixture loss angle tangent value
≤ 2.5 × 10-4
Table two, LKI-1 inductance group typical test data
Coil test frequency distributions of Q values of P inductance capacitance
9 100KHz 989.4 25mH
8 400KHz 13811.4 4.87mH
7 400KHz 20216 0.99mH
6 1MHz 19613252 H
5 2MHz 1988.7 49.8 μ
4 4.5MHz 231710 H
3 12MHz 1936.9 2.49 μ
2 12MHz 2296.4 0.508 μ
1 25MHz 50MHz 2332110.9 0.125 μ
Tags: dielectric loss tester dielectric constant test dielectric loss tester dielectric lossdielectric constant test